:::
Journal paper
Date of publication2009-02-00
Journal levelSCI
Paper title (chapter)A New Two-dimensional Analytical Subthreshold Behavior Model for Short-channel Tri-material Gate-stack SOI MOSFET’s
Name of journalMicroelectronics Reliability
number of chaptersvol.49
Issue No.no.2
起頁113
迄頁119
Name of author (Chinese)Te-Kung Chiang
Name of author (English)Te-Kung Chiang
AuthorsT.K. Chiang
Language usedEnglish

Calendar

« June 2019»
Mon.Tue.Wed.Thu.Fri.Sat.Sun.
     0102
03040506070809
10111213141516
17181920212223
24252627282930
Decorative image

Decorative image

Decorative image

Gallery

Decorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative image
Read more
cron web_use_log