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Journal paper
Date of publication2009-02-00
Journal levelSCI
Paper title (chapter)A New Two-dimensional Analytical Subthreshold Behavior Model for Short-channel Tri-material Gate-stack SOI MOSFET’s
Name of journalMicroelectronics Reliability
number of chaptersvol.49
Issue No.no.2
起頁113
迄頁119
Name of author (Chinese)Te-Kung Chiang
Name of author (English)Te-Kung Chiang
AuthorsT.K. Chiang
Language usedEnglish

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