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Journal paper
Date of publication2007-09-00
Journal levelSCI / 其他
Paper title (chapter)The Impact of Mobility Enhanced Technology on Device Performance and Reliability for sub-90nm SOI nMOSFETs
Name of journalMicroelectronic Engineering
number of chapters84
Issue No.9-10
起頁2077
迄頁2080
Total number of pages4
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsWen-Kuan Yeh
Number of authors1
Author's typeFirst Author / Corresponding Author
Language usedEnglish

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