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Journal paper
Date of publication2007-02-00
Journal levelSCI / EI
Paper title (chapter)A Novel Strain Method for Enhancement of 90-nm Node and Beyond FUSI-Gated CMOS Performance
Name of journalIEEE Electron Device Letters
number of chapters28
Issue No.2
起頁111
迄頁113
Total number of pages3
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsChien-Ting Lin, Yean-Kuen Fang, Wen-Kuan Yeh, Tung-Hsing Lee, Ming-Shing Chen, Chieh-Ming Lai, Che-Hua Hsu, Liang-Wei Chen, Li-Wei Cheng, and Mike Ma
Number of authors10
Author's typeCorresponding Author
Language usedEnglish

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