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Journal paper
Date of publication2005-02-00
Journal levelSCI
Paper title (chapter)A Scaling theory for Fully-depleted, Surrounding-gate MOSFET’s: including effective conducting path effect
Name of journalMicroelectronic Engineering
number of chaptersvol.77
Issue No.no.2
起頁175
迄頁183
Name of author (Chinese)Te-Kung Chiang
Name of author (English)Te-Kung Chiang
AuthorsT. K. Chiang
Number of authors1
Language usedEnglish

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