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| Date of publication | 2010-08-00 |
|---|---|
| Journal level | SCI / EI |
| Paper title (chapter) | External Stresses on Tensile and Compressive Contact Etching Stop Layer SOI MOSFETs |
| Name of journal | IEEE Transactions on Electron Devices |
| number of chapters | 57 |
| Issue No. | 8 |
| 起頁 | 1889 |
| 迄頁 | 1894 |
| Total number of pages | 6 |
| Name of author (Chinese) | Wen-Kuan Yeh |
| Name of author (English) | Wen-Kuan Yeh |
| Authors | Wen-Teng Chang,Chih-Chung Wang(王治忠),Jian-An Lin(林建安),and Wen-Kuan Yeh |
| Number of authors | 4 |
| Author's type | Corresponding Author |
| Reference URL | http://ieeexplore.ieee.org/search/freesrchabstract.jsp?tp=&arnumber=5497124&queryText%3DExternal+Stresses+on+Tensile+and+Compressive+Contact+Etching+Stop+Layer+SOI+MOSFETs%26openedRefinements%3D*%26searchField%3DSearch+All |
| Language used | English |
