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Journal paper
Date of publication2011-03-00
Journal levelSCI / EI
Paper title (chapter)Effect of NH3 Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-κ Dielectric nMOSFETs
Name of journalIEEE Transactions on Electron Devices
number of chapters58
Issue No.3
起頁812
迄頁818
Total number of pages7
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsYu-Ting Chen, Kun-Ming Chen,Cheng-Li Lin, Wen-Kuan Yeh,Guo-Wei Huang, Chien-Ming Lai, Yi-Wen Chen, Che-Hua Hsu, and Fon-Shan Huang
Number of authors9
Author's typeOther
Language usedEnglish

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