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Journal paper
Date of publication2005-09-00
Journal levelSCI
Paper title (chapter)A Generalized Electrostatic Scale Length for Fully depleted Surrounding-Gate Metal-oxide-semiconductor Field Effect Transistors
Name of journalJapanese Journal of Applied Physics
number of chaptersvol.44
Issue No.no.9A
起頁6452
迄頁6457
Name of author (Chinese)Te-Kung Chiang
Name of author (English)Te-Kung Chiang
AuthorsT. K. Chiang
Language usedEnglish

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