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| Date of publication | 2008-04-00 |
|---|---|
| Journal level | SCI / 其他 |
| Paper title (chapter) | High-efficiency test pattern generating mechanism |
| Name of journal | International Journal of Electronics |
| number of chapters | vol.95 |
| Issue No. | no.4 |
| 起頁 | 371 |
| 迄頁 | 382 |
| Total number of pages | 12 |
| Name of author (Chinese) | Chuen-Yau Chen |
| Name of author (English) | Chuen-Yau Chen |
| Authors | C. Y. Chen |
| Number of authors | 1 |
| Author's type | First Author |
| Language used | English |
