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Date of publication | 2008-04-00 |
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Journal level | SCI / 其他 |
Paper title (chapter) | High-efficiency test pattern generating mechanism |
Name of journal | International Journal of Electronics |
number of chapters | vol.95 |
Issue No. | no.4 |
起頁 | 371 |
迄頁 | 382 |
Total number of pages | 12 |
Name of author (Chinese) | Chuen-Yau Chen |
Name of author (English) | Chuen-Yau Chen |
Authors | C. Y. Chen |
Number of authors | 1 |
Author's type | First Author |
Language used | English |