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Journal paper
Date of publication2006-11-00
Journal level其他
Paper title (chapter)ICP-induced defects in GaN characterized by capacitance analysis
Name of journalSolid-State Electronics
number of chaptersvol.50
Issue No.Issues 11-12
起頁1677
迄頁1681
Name of author (Chinese)Wen-How Lan
Name of author (English)Wen-How Lan
AuthorsWen-How Lan, Kuo-Chin Huang and Kai Feng Huang
Number of authors3
Author's typeFirst Author
Language usedEnglish

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