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Journal paper
Date of publication2010-06-00
Journal levelSCI
Paper title (chapter)Impact of Strain on Hot Electron Reliability of Dual-Band Power Amplifier and Integrated LNA-Mixer RF Performances
Name of journalMicroelectronics Reliability
number of chapters50
Issue No.6
起頁807
迄頁812
Total number of pages6
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsJ.S. Yuan, J. Ma, C.W. Hsu, and Wen-Kuan Yeh
Number of authors4
Author's typeCorresponding Author
Language usedEnglish

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