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Date of publication | 2010-06-00 |
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Journal level | SCI |
Paper title (chapter) | Impact of Strain on Hot Electron Reliability of Dual-Band Power Amplifier and Integrated LNA-Mixer RF Performances |
Name of journal | Microelectronics Reliability |
number of chapters | 50 |
Issue No. | 6 |
起頁 | 807 |
迄頁 | 812 |
Total number of pages | 6 |
Name of author (Chinese) | Wen-Kuan Yeh |
Name of author (English) | Wen-Kuan Yeh |
Authors | J.S. Yuan, J. Ma, C.W. Hsu, and Wen-Kuan Yeh |
Number of authors | 4 |
Author's type | Corresponding Author |
Language used | English |