:::
| Date of publication | 2010-06-00 |
|---|---|
| Journal level | SCI |
| Paper title (chapter) | Impact of Strain on Hot Electron Reliability of Dual-Band Power Amplifier and Integrated LNA-Mixer RF Performances |
| Name of journal | Microelectronics Reliability |
| number of chapters | 50 |
| Issue No. | 6 |
| 起頁 | 807 |
| 迄頁 | 812 |
| Total number of pages | 6 |
| Name of author (Chinese) | Wen-Kuan Yeh |
| Name of author (English) | Wen-Kuan Yeh |
| Authors | J.S. Yuan, J. Ma, C.W. Hsu, and Wen-Kuan Yeh |
| Number of authors | 4 |
| Author's type | Corresponding Author |
| Language used | English |
