:::
Journal paper
Date of publication2012-05-01
Journal levelSCI
Paper title (chapter)Stress-induced capacitance of partially depleted MOSFETs from ring oscillator delay
Name of journalIEICE Transactions on Electronics
number of chaptersE95-C
Issue No.5
起頁802
迄頁806
Total number of pages5
Name of author (Chinese)Wen-Teng Chang
Name of author (English)Wen-Teng Chang
AuthorsWen-Teng Chang
Number of authors1
Author's typeFirst Author / Corresponding Author
ISSN(ISBN) 0916-8524

Calendar

« August 2019»
Mon.Tue.Wed.Thu.Fri.Sat.Sun.
   01020304
05060708091011
12131415161718
19202122232425
262728293031
Decorative image

Decorative image

Decorative image

Gallery

Decorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative image
Read more
cron web_use_log