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Date of publication | 2012-05-01 |
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Journal level | SCI |
Paper title (chapter) | Stress-induced capacitance of partially depleted MOSFETs from ring oscillator delay |
Name of journal | IEICE Transactions on Electronics |
number of chapters | E95-C |
Issue No. | 5 |
起頁 | 802 |
迄頁 | 806 |
Total number of pages | 5 |
Name of author (Chinese) | Wen-Teng Chang |
Name of author (English) | Wen-Teng Chang |
Authors | Wen-Teng Chang |
Number of authors | 1 |
Author's type | First Author / Corresponding Author |
ISSN(ISBN) | 0916-8524 |