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Journal paper
Date of publication2012-05-00
Journal levelSCI
Paper title (chapter)RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments
Name of journalMicroelectronics Reliability
number of chapters12
Issue No.2
起頁369
迄頁374
Total number of pages6
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsH.D. Yen, J.S. Yuan, R.L. Wang, G.W. Huang, W.K. Yeh , and F.S. Huang
Number of authors6
Author's typeOther
NoteIn Press

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