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Journal paper
Date of publication2012-04-00
Journal levelEI
Paper title (chapter)The Improvement of Reliability of High-k/Metal Gate pMOSFET Device with Various PMA Conditions
Name of journalActive and Passive Electronic Components
number of chapters2012
Issue No.Article ID 872494
起頁.
迄頁.
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsYi-Lin Yang, Wenqi Zhang, Chi-Yun Cheng and Wen-kuan Yeh
Number of authors4

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