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| Date of publication | 2012-07-30 |
|---|---|
| Journal level | SCI |
| Paper title (chapter) | The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET |
| Name of journal | Microelectronics Reliability |
| number of chapters | 10 |
| Issue No. | 2 |
| 起頁 | 11 |
| 迄頁 | 16 |
| Total number of pages | 5 |
| Name of author (Chinese) | Wen-Kuan Yeh |
| Name of author (English) | Wen-Kuan Yeh |
| Authors | Wen-Kuan Yeh , Po-Ying Chen , Kwang-Jow Gan , Jer-Chyi Wang , Chao Sung Lai |
| Number of authors | 5 |
| Author's type | Other |
