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Journal paper
Date of publication2012-07-30
Journal levelSCI
Paper title (chapter)The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET
Name of journalMicroelectronics Reliability
number of chapters10
Issue No.2
起頁11
迄頁16
Total number of pages5
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsWen-Kuan Yeh , Po-Ying Chen , Kwang-Jow Gan , Jer-Chyi Wang , Chao Sung Lai
Number of authors5
Author's typeOther

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