:::
Journal paper
Date of publication2012-07-30
Journal levelSCI
Paper title (chapter)The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET
Name of journalMicroelectronics Reliability
number of chapters10
Issue No.2
起頁11
迄頁16
Total number of pages5
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsWen-Kuan Yeh , Po-Ying Chen , Kwang-Jow Gan , Jer-Chyi Wang , Chao Sung Lai
Number of authors5
Author's typeOther

Calendar

« April 2019»
Mon.Tue.Wed.Thu.Fri.Sat.Sun.
01020304050607
08091011121314
15161718192021
22232425262728
2930
Decorative image

Decorative image

Decorative image

Gallery

Decorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative image
Read more
cron web_use_log