:::
Journal paper
Date of publication2011-01-10
Journal levelSCI
Paper title (chapter)Effect of Gate Capping Configurations and Silicon-on-Insulator Thickness with External Stresses on Partially Depleted MOSFETs
Name of journalJournal of Vacuum Science and Technology B
number of chapters29
Issue No.1
起頁1071
迄頁1023
Total number of pages4
Name of author (Chinese)Wen-Teng Chang
Name of author (English)Wen-Teng Chang
AuthorsWen-Teng Chang, Chih-Chung Wang, Jian-An Lin, Wen-Kuan Yeh
Number of authors4
Author's typeFirst Author / Corresponding Author
ISSN(ISBN)98-2221-E-390-025-MY2
Language usedEnglish

Calendar

« December 2019»
Mon.Tue.Wed.Thu.Fri.Sat.Sun.
      01
02030405060708
09101112131415
16171819202122
23242526272829
3031
Decorative image

Decorative image

Decorative image

Gallery

Decorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative image
Read more
cron web_use_log