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Journal paper
Date of publication2014-02-24
Journal levelSCI
Paper title (chapter)Examination of hot-carrier stress induced degradation on fin field-effect transistor
Name of journalApplied Physics Letters
number of chapters104
Issue No.10
起頁1063
迄頁1066
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsYi-Lin Yang, Tzu-Sung Yen, Jia-Jian Hong(洪嘉鍵), Jie-Chen Wong(翁介辰), Chao-Chen Ku, Tai-Hsuan Wu, Tzuo-Li Wang, Chien-Yi Li, Bing-Tze Wu, Shih-Hung Lin, Wen-Kuan Yeh
Number of authors11
Author's typeOther
Language usedEnglish

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