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Date of publication | 2015-01-00 |
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Journal level | SCI |
Paper title (chapter) | Impact of Fin Width and Back Bias under Hot Carrier Injection on Double-Gate FinFETs |
Name of journal | IEEE Transactions on Device and Materials Reliability |
number of chapters | 15 |
Issue No. | 1 |
起頁 | 86 |
迄頁 | 89 |
Total number of pages | 4 |
Name of author (Chinese) | Wen-Teng Chang |
Name of author (English) | Wen-Teng Chang |
Authors | Wen-Teng Chang, Li-Gong Cin, Wen-Kuan Yeh |
Number of authors | 3 |
Author's type | First Author / Corresponding Author |
Language used | English |