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| 出版日期 | 2016-09-00 |
|---|---|
| 期刊等級 | SCI |
| 論文名稱(篇名) | The Observation of Width Quantization Impact on Device Performance and Reliability for High-k/Metal Tri-Gate FinFET |
| 期刊名 | IEEE Transaction on Device and Materials Reliability |
| 卷數 | 16 |
| 期數 | 4 |
| 起頁 | 610 |
| 迄頁 | 616 |
| 總頁數 | 7 |
| 作者中文名 | 葉文冠 |
| 作者英文名 | Wen-Kuan Yeh |
| 全部作者 | Wen-Kuan Yeh, Wenqi Zhang, Yi-Lin Yang, An-Ni Dai(戴安妮), Kehuey Wu, Tung-Huan Chou, Cheng-Li Lin, Kwang-Jow Gan, Chia-Hung Shih and Po-Ying Chen |
| 著作人數 | 10 |
| 作者型態 | First Author |
