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Journal paper
Date of publication2018-01-00
Journal levelSCI
Paper title (chapter)Back-biasing to Performance and Reliability Evaluation of UTBB FDSOI, Bulk FinFETs, and SOI FinFETs
Name of journalIEEE Transactions on Nanotechnology
number of chapters17
Issue No.1
起頁36
迄頁40
Total number of pages5
Name of author (Chinese)Wen-Teng Chang
Name of author (English)Wen-Teng Chang
AuthorsWen-Teng Chang; Cheng-Ting Shih(施政廷); Jhao-Lin Wu(吳昭霖); Shih-Wei Lin(林士瑋); Wen-Kuan Yeh
Number of authors5
Author's typeFirst Author / Corresponding Author
Language usedEnglish

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