:::
Seminar paper
Year2008
Paper type會議論文
Paper level其他
Paper title (chapter)A New Two-dimensional Analytical Subthreshold Behavior Model for Tri-material Gate-Stack SOI MOSFET's December 20-22. (Invited Paper)
Name of conference2008 IEEE International Conference on Eldectron Devices and Solid-State Circuits
Conference starting time2008-12-20
Conference closing time2008-12-22
Name of author (Chinese)Te-Kung Chiang
Name of author (English)Te-Kung Chiang
AuthorsT.K. Chiang
LocationTainan, Taiwan
Language usedEnglish

Calendar

« May 2020»
Mon.Tue.Wed.Thu.Fri.Sat.Sun.
    010203
04050607080910
11121314151617
18192021222324
25262728293031
Decorative image

Decorative image

Decorative image

Gallery

Decorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative image
Read more
cron web_use_log