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Seminar paper
Year2008
Paper type會議論文
Paper level其他
Paper title (chapter)A New Two-dimensional Analytical Subthreshold Behavior Model for Tri-material Gate-Stack SOI MOSFET's December 20-22. (Invited Paper)
Name of conference2008 IEEE International Conference on Eldectron Devices and Solid-State Circuits
Conference starting time2008-12-20
Conference closing time2008-12-22
Name of author (Chinese)Te-Kung Chiang
Name of author (English)Te-Kung Chiang
AuthorsT.K. Chiang
LocationTainan, Taiwan
Language usedEnglish

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