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Seminar paper
Year2008
Paper type受邀演講
Paper level其他
Paper title (chapter)The Impact of Strain Technology on Device Characteristic and Reliability for FUSI Gate SOI CMOSFET
Name of conferenceIEDMS
Conference starting time2008-11-00
Conference closing time2008-11-00
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsWen-Kuan Yeh, Jean-An Wang , Chien-Ting Lin
Number of authors3
Author's typeFirst Author
LocationTaiwan
Language usedEnglish

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