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Seminar paper
Year2007
Paper type其他
Paper level其他
Paper title (chapter)The Impact of Strain Technology on Device Performance and Reliability for sub-90nm FUSI SOI MOSFETs
Name of conferenceIEEE Proceedings of EDSSC
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsJiun-Yu Chen, Jean-An Wang, Wen-Kuan Yeh
Number of authors3
Author's typeCorresponding Author
LocationTainan, Taiwan
Language usedEnglish

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