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Seminar paper
Year2007
Paper type其他
Paper level其他
Paper title (chapter)The Impact of Strain Technology on Device Performance and Reliability for sub-90nm SOI nMOSFETs
Name of conferenceIEEE Proceedings of IEDMS
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsJean-An Wang, Jiun-Yu Chen, Chia-Wei Hsu, Wen-Kuan Yeh
Number of authors4
Author's typeCorresponding Author
LocationHsinChu, Taiwan
Language usedEnglish

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