:::
Seminar paper
Year2006
Paper type受邀演講
Paper level其他
Paper title (chapter)The impact of Stress Enhanced Technology for sub-90nm SOI MOSFETs
Name of conferenceInternational Conference on Solid-State and Integrated-Circuit Technology
Conference starting time2006-10-00
Conference closing time2006-10-00
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsWen-Kuan Yeh, Chieh-Ming Lai, Chien-Ting Lin, Yean-Kuen Fang
Number of authors4
Author's typeFirst Author
LocationShanghai, China
Language usedEnglish

Calendar

« April 2019»
Mon.Tue.Wed.Thu.Fri.Sat.Sun.
01020304050607
08091011121314
15161718192021
22232425262728
2930
Decorative image

Decorative image

Decorative image

Gallery

Decorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative image
Read more
cron web_use_log