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Seminar paper
Year2006
Paper type受邀演講
Paper level其他
Paper title (chapter)The impact of Stress Enhanced Technology for sub-90nm SOI MOSFETs
Name of conferenceInternational Conference on Solid-State and Integrated-Circuit Technology
Conference starting time2006-10-00
Conference closing time2006-10-00
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsWen-Kuan Yeh, Chieh-Ming Lai, Chien-Ting Lin, Yean-Kuen Fang
Number of authors4
Author's typeFirst Author
LocationShanghai, China
Language usedEnglish

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