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Seminar paper
Year2006
Paper type其他
Paper level其他
Paper title (chapter)he Impact of Strained Engineering for 65nm FUSI CMOSFETs
Name of conferenceIEEE Proceedings of Device Research Conference
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsChieh-Ming Lai, Yean-Kuen Fang, Wen-Kuan Yeh, Chien-Ting Lin
Number of authors4
Author's typeCorresponding Author
LocationPenn State
Language usedEnglish

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