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Seminar paper
Year2007
Paper type會議論文
Paper level其他
Paper title (chapter)A three analytical model for subthreshold behavior in fully depleted SOI FINFET
Name of conference2007 International Symposium on Nano Science and Technology
Conference starting time2007-00-00
Conference closing time2007-00-00
Name of author (Chinese)Te-Kung Chiang
Name of author (English)Te-Kung Chiang
AuthorsT. K. Chiang and M. L. Chen
Author's typeFirst Author
Language usedEnglish

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