:::
| Year | 2009 |
|---|---|
| Paper type | 口頭報告 |
| Paper title (chapter) | Impact of Oxide Trap Charge on Performance of Strained Fully Depleted SOI Metal-Gate MOSFET |
| Name of conference | EDSSC |
| Conference starting time | 2009-06-07 |
| Conference closing time | 2009-06-11 |
| Name of author (Chinese) | Wen-Kuan Yeh |
| Name of author (English) | Wen-Kuan Yeh |
| Authors | W. K. Yeh, C. C. Wang, C.W. Hsu, Y.K. Fang, S. M. Wu, C. C. Ou, C. L. Lin, K. J. Gan, C. J. Weng, P. Y. Chen, J. S. Yuan, and J. J. Liou |
| Number of authors | 12 |
| Author's type | First Author |
| Location | Xi'an, China |
| Language used | English |
