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Seminar paper
Year2009
Paper type口頭報告
Paper title (chapter)Impact of Oxide Trap Charge on Performance of Strained Fully Depleted SOI Metal-Gate MOSFET
Name of conferenceEDSSC
Conference starting time2009-06-07
Conference closing time2009-06-11
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsW. K. Yeh, C. C. Wang, C.W. Hsu, Y.K. Fang, S. M. Wu, C. C. Ou, C. L. Lin, K. J. Gan, C. J. Weng, P. Y. Chen, J. S. Yuan, and J. J. Liou
Number of authors12
Author's typeFirst Author
LocationXi'an, China
Language usedEnglish

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