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Seminar paper
Year2010
Paper type口頭報告
Paper levelSCI
Paper title (chapter)Characterization the Random Telegraph Noise in High-k/Metal gate device for 32nm nMOSFETs and pMOSFET
Name of conferenceSolid-State Device and Materials
Conference starting time2010-09-20
Conference closing time2010-09-23
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsW. K. Yeh, C. W. Hsu, Y. K. Fang, C. Y. Chen, C. T. Lin, P. Y. Chen
Number of authors6
Author's typeFirst Author
LocationTokyo, Japan
Language usedEnglish

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