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Seminar paper
Year2010
Paper type會議論文
Paper level其他
Paper title (chapter)A new two-dimensional analytical model for the threshold voltage in single-layer fully depleted strained-silicon-on-insulator MOSFETs
Name of conferenceConference on microelectronics technology & applications
Conference starting time2010-05-21
Conference closing time2010-05-21
Name of author (Chinese)Te-Kung Chiang
Name of author (English)Te-Kung Chiang
AuthorsT.K. Chiang, Lai Jan-Fan(賴俊帆), and Yang Ming-Jie(楊鳴傑)
Number of authors3
LocationTaiwan
Language usedEnglish

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