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Seminar paper
Year2005
Paper type會議論文
Paper level其他
Paper title (chapter)An 3D Analytical Subthreshold Behavior Model For Fully-depleted SOI FINFET
Name of conference2005 International Symposium on Nano Science and Technology
Conference starting time2005-00-00
Conference closing time2005-00-00
Name of author (Chinese)Te-Kung Chiang
Name of author (English)Te-Kung Chiang
AuthorsT.K. Chiang, C.S.Kao,
Author's typeFirst Author
LocationTainan,Taiwan
Language usedEnglish

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