:::
| Year | 2011 |
|---|---|
| Paper type | 口頭報告 |
| Paper title (chapter) | Capping Layer Induced Degradation in Nano MOSFET with Scaled IL |
| Name of conference | IEEE International NanoElectronics Conference (INEC) |
| Conference starting time | 2011-06-21 |
| Conference closing time | 2011-06-24 |
| Name of author (Chinese) | Wen-Kuan Yeh |
| Name of author (English) | Wen-Kuan Yeh |
| Authors | T-H Lee, S-M Chen, C-W Hsu, Y-K Fang, F-R-Juang, W-K Yeh |
| Number of authors | 6 |
| Author's type | Corresponding Author |
| Location | Taoyuan, Taiwan |
| Language used | English |
