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Seminar paper
Year2011
Paper type口頭報告
Paper title (chapter)Capping Layer Induced Degradation in Nano MOSFET with Scaled IL
Name of conferenceIEEE International NanoElectronics Conference (INEC)
Conference starting time2011-06-21
Conference closing time2011-06-24
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsT-H Lee, S-M Chen, C-W Hsu, Y-K Fang, F-R-Juang, W-K Yeh
Number of authors6
Author's typeCorresponding Author
LocationTaoyuan, Taiwan
Language usedEnglish

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