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Seminar paper
Year2012
Paper type口頭報告
Paper levelEI
Paper title (chapter)Impact of Doping Concentration on Device Characteristics and Reliability in Ultra-Thin-Body and BOX(UTBB) MOSFETs(傑出論文獎)
Name of conferenceInternational Electron Devices and Materials Symposia (IEDMS)
Conference starting time2012-11-29
Conference closing time2012-11-29
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsWenqi Zhang , Jhe-Hao Chang(張哲豪) , Yen-Hsin Chen(陳彥馨) , Yi-Lin Yang , Chun-Ming Lai(賴俊銘) , Shi-Hao Wang , Li-Kong Chin(秦禮功) , Wen-Kuan Yeh
Number of authors8
Author's typeOther
LocationKaohsiung , Taiwan
Language usedEnglish

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