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Seminar paper
Year2012
Paper type受邀演講
Paper levelSCI
Paper title (chapter)A Proposed High Manufacturability Strain Technology for High-k/Metal Gate SiGe channel UTBB CMOSFET
Name of conferenceInternational Conference on Software and Computing Technology
Conference starting time2012-11-00
Conference closing time2012-11-00
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsWen-Kuan Yeh , P.Y. Chen , Y.L Yang
Number of authors3
Author's typeOther
LocationXian,China

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