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Seminar paper
Year2012
Paper type海報展示
Paper levelSCI
Paper title (chapter)Characterization and Improvement of Charge Trapping in Gd incoporatrated Hf based high-k/Metal gate nMOSFET
Name of conferenceSolid-State Device and Materials
Conference starting time2012-10-07
Conference closing time2012-10-09
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsC.W. Chen ,C.T. Lin , W.K. Yeh
Number of authors3
Author's typeOther
LocationSendi, Japan

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