:::
| Year | 2014 |
|---|---|
| Paper type | 會議論文 |
| Paper title (chapter) | Back biases and positive bias temperature instability on low and high doped ultrathin body and buried oxide siliocn-on-insulator |
| Name of conference | IEEE Silicon Nanoelectronics Workshop |
| Conference starting time | 2014-06-08 |
| Conference closing time | 2014-06-09 |
| Name of author (Chinese) | Wen-Teng Chang |
| Name of author (English) | Wen-Teng Chang |
| Authors | Wen-Teng Chang, Sheng-Ting Shih(施政廷), Chien-Hung, Yeh(葉建銘), Wen-Kuan Yeh |
| Number of authors | 4 |
| Author's type | First Author / Corresponding Author |
| Location | Hawaii, USA |
| Language used | English |
