:::
Seminar paper
Year2014
Paper type會議論文
Paper title (chapter)Back biases and positive bias temperature instability on low and high doped ultrathin body and buried oxide siliocn-on-insulator
Name of conferenceIEEE Silicon Nanoelectronics Workshop
Conference starting time2014-06-08
Conference closing time2014-06-09
Name of author (Chinese)Wen-Teng Chang
Name of author (English)Wen-Teng Chang
AuthorsWen-Teng Chang, Sheng-Ting Shih(施政廷), Chien-Hung, Yeh(葉建銘), Wen-Kuan Yeh
Number of authors4
Author's typeFirst Author / Corresponding Author
LocationHawaii, USA
Language usedEnglish

Calendar

« August 2019»
Mon.Tue.Wed.Thu.Fri.Sat.Sun.
   01020304
05060708091011
12131415161718
19202122232425
262728293031
Decorative image

Decorative image

Decorative image

Gallery

Decorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative image
Read more
cron web_use_log