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Seminar paper
Year2014
Paper type會議論文
Paper title (chapter)Back biases and positive bias temperature instability on low and high doped ultrathin body and buried oxide siliocn-on-insulator
Name of conferenceIEEE Silicon Nanoelectronics Workshop
Conference starting time2014-06-08
Conference closing time2014-06-09
Name of author (Chinese)Wen-Teng Chang
Name of author (English)Wen-Teng Chang
AuthorsWen-Teng Chang, Sheng-Ting Shih(施政廷), Chien-Hung, Yeh(葉建銘), Wen-Kuan Yeh
Number of authors4
Author's typeFirst Author / Corresponding Author
LocationHawaii, USA
Language usedEnglish

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