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Seminar paper
Year2014
Paper type口頭報告 / 會議論文
Paper level其他
Paper title (chapter)A New Interface-Trapped-Charge-Degraded Subthreshold Current Model for Cylindrical, Surrounding-Gate (CSRG) MOSFETs
Name of conferenceISNE2014
Conference starting time2014-05-07
Conference closing time2014-05-10
Name of author (Chinese)Te-Kung Chiang
Name of author (English)Te-Kung Chiang
AuthorsTe-Kuang Chiang, Hong-Wun Gao(高鴻文), Che-Wei Liu, Tsung-Ying Tsou and Yi-Hung Chiu(邱翊紘)
Number of authors5
Author's typeFirst Author
Location長庚大學

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