:::
Seminar paper
Year2014
Paper type會議論文
Paper title (chapter)Hot Carrier Injection on Back Biasing Double-Gate FinFET with 10 and 25-nm Fin Width
Name of conference2014 21th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Conference starting time2014-06-30
Conference closing time2014-07-04
Name of author (Chinese)Wen-Teng Chang
Name of author (English)Wen-Teng Chang
AuthorsWen-Teng Chang, Li-Gong Cin, Wen-Kuan Yeh, Po-Ying Chen
Number of authors4
Author's typeFirst Author / Corresponding Author
LocationSingapore
Language usedEnglish

Calendar

« April 2019»
Mon.Tue.Wed.Thu.Fri.Sat.Sun.
01020304050607
08091011121314
15161718192021
22232425262728
2930
Decorative image

Decorative image

Decorative image

Gallery

Decorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative image
Read more
cron web_use_log