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Seminar paper
Year2014
Paper type會議論文
Paper title (chapter)Hot Carrier Injection on Back Biasing Double-Gate FinFET with 10 and 25-nm Fin Width
Name of conference2014 21th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Conference starting time2014-06-30
Conference closing time2014-07-04
Name of author (Chinese)Wen-Teng Chang
Name of author (English)Wen-Teng Chang
AuthorsWen-Teng Chang, Li-Gong Cin, Wen-Kuan Yeh, Po-Ying Chen
Number of authors4
Author's typeFirst Author / Corresponding Author
LocationSingapore
Language usedEnglish

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