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Seminar paper
Year2014
Paper type會議論文
Paper levelSCI
Paper title (chapter)Junction induced Variation and Reliability for Ultra-Thin-Body and Bulk Oxide CMOSFETs
Name of conferenceIPFA 2014 FINAL PROGRAMME
Conference starting time2014-06-30
Conference closing time2014-07-04
Name of author (Chinese)Wen-Kuan Yeh
Name of author (English)Wen-Kuan Yeh
AuthorsWen-Kuan Yeh, Wen-Teng Chang, Po-Ying Chen and Cheng-Li Lin
Number of authors4
Author's typeFirst Author
LocationMarina Bay Sands , SINGAPORE
sponsorIEEE Singapore Reliability/CPMT/ED Chapter
Language usedEnglish

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