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Seminar paper
Year2014
Paper type會議論文
Paper level其他
Paper title (chapter)Junction induced Variation and Reliability for Ultra-Thin-Body and Bulk Oxide
Name of conference2014 21th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
Conference starting time2014-06-30
Conference closing time2014-07-04
Name of author (Chinese)Wen-Teng Chang
Name of author (English)Wen-Teng Chang
AuthorsWen-Kuan Yeh, wen-Teng Chang, Po-Ying Chen, Cheng-Li Lin
Number of authors4
Author's typeOther
LocationSingapore

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