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Seminar paper
Year2010
Paper type會議論文 / 其他
Paper levelSCI
Paper title (chapter)Detecting Defects on Planar Circuits by Using Non-contacting Magnetic Probe
Name of conference2010 Asia-Pacific Microwave Conference (APMC)
Conference starting time2010-12-07
Conference closing time2010-12-10
Name of author (Chinese)Song-Mao Wu
Name of author (English)Song-Mao Wu
AuthorsSung-Mao Wu, Tai-Chiuan Wang(王泰權) and Chiao-Han Lan(藍巧涵)
Number of authors3
Author's typeFirst Author
LocationYokohama, Japan
Language usedEnglish

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