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Seminar paper
Year2010
Paper type會議論文 / 其他
Paper level其他
Paper title (chapter)Impact of Gate Capping and SOI Thickness with Compressive Stresses on Partially Depleted MOSFETs
Name of conferenceIEEE, International Workshop on Next Generation Electronics
Conference starting time2010-11-18
Conference closing time2010-11-19
Name of author (Chinese)Wen-Teng Chang
Name of author (English)Wen-Teng Chang
AuthorsWen-Teng Chang, Jian-An Lin, and Ming-Feng Li
Number of authors3
Author's typeFirst Author
Language usedEnglish

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