:::
Seminar paper
Year2017
Paper type口頭報告 / 海報展示
Paper levelEI
Paper title (chapter)A Short-Channel-Effect-Degraded Noise Margin Model for Junctionless Quadruple-Gate MOSFETs Working on Low Power CMOS Logic Gates
Name of conferenceInternational Electron Devices & Materials Symposium 2017 (IEDMS 2017)
Conference starting time2017-09-06
Conference closing time2017-09-08
Name of author (Chinese)Te-Kung Chiang
Name of author (English)Te-Kung Chiang
AuthorsHong-Wun Gao,Yeong-Her Wang,Ying-Wen Ko(柯盈彣) and Te-Kuang Chiang
Number of authors4
Author's typeCorresponding Author
Location National Chiao Tung University, Taiwan
Language usedEnglish

Calendar

« September 2019»
Mon.Tue.Wed.Thu.Fri.Sat.Sun.
      01
02030405060708
09101112131415
16171819202122
23242526272829
30
Decorative image

Decorative image

Decorative image

Gallery

Decorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative imageDecorative image
Read more
cron web_use_log