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Seminar paper
Year2017
Paper type口頭報告 / 受邀演講 / 海報展示
Paper levelEI
Paper title (chapter)A New Short-Channel-Effect-Degraded Subthreshold Behavior Model for Elliptical Gate-All-Around MOSFET
Name of conferenceIEEE - 2017 IEEE 12th International Conference on ASIC (ASICON)
Conference starting time2017-10-25
Conference closing time2017-10-28
Name of author (Chinese)Te-Kung Chiang
Name of author (English)Te-Kung Chiang
AuthorsTe-Kuang Chiang, Ying-Wen Ko(柯盈彣), Hong-Wun Gao, Yeong-Her Wang
Number of authors4
Author's typeFirst Author / Corresponding Author
LocationGuiyang, China
Language usedEnglish

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