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Seminar paper
Year2018
Paper type口頭報告 / 會議論文 / 海報展示
Paper levelEI
Paper title (chapter)A UNIFIED QUANTUM SCALING LENGTH MODEL FOR NANOMETER MULTIPLE-GATE MOSFETS
Name of conferenceThe 7th IEEE International Symposium on Next-Generation Electronics (ISNE 2018)
Conference starting time2018-05-07
Conference closing time2018-05-09
Name of author (Chinese)Te-Kung Chiang
Name of author (English)Te-Kung Chiang
AuthorsTe-Kuang Chiang, Ying-Wen Ko(柯盈彣), Yu-Hsuan Lin(林佑萱),Hong-Wun Gao, Yeong-Her Wang
Number of authors5
Author's typeFirst Author / Corresponding Author
LocationTaipei, Tawan

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